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Training sessions
Prior to this year's "East meets West" forum, on 16 April 2008, we will offer practical training courses on the Japanese FI/F-terms classifications and on the Korean KIPRIS database. Apart from presentations given by experts from the EPO and KIPI, these sessions include a hands-on part, during which participants will be able to work on practical search examples.
The training sessions will take place at the EPO Vienna on Wednesday, 16 April 2008, from 14:00 to 17:00 hrs.
Making the most of the KIPRIS database
The "Korea Industrial Property Rights Information Service" (KIPRIS) provides access to the Korean Patent Office's patent data and is available to the public free of charge. Korean Patent Abstracts (KPA) used to be the only database on KIPRIS allowing English language searches, but in 2005 new English search interfaces for the Korean patent and utility model gazettes and for trade marks and designs were added to the system. The latest addition is the K2E-PAT service, which offers machine-translated full texts of Korean patents and utility models.
In this hands-on training, a KIPRIS expert from the Korea Institute of Patent Information (KIPI) will introduce you to the advanced search functions on KIPRIS and demonstrate the search possibilities for the full range of Korean industrial property rights. A part of the session will be dedicated to the new K2E-PAT service and the cross-lingual patent retrieval feature on KIPRIS. You will also learn about the improved coverage of legal status data in English.
In the practical part of the training session, you will be able to work on search examples. You will use the cross-lingual patent retrieval feature to search with English keywords in original Korean full texts. You will learn how to retrieve machine translations of Korean patent and utility model documents. And you will get practical tips on retrieving detailed legal status information in English, and on how to fill the gaps in English coverage by accessing information on the Korean patent register.
Understanding FI and F-terms
The FI and F-terms classification systems were created by the Japan Patent Office (JPO) in order to achieve more effective prior art searches and to cope with emerging new technologies in Japan. Successful searches for those areas of technology where US and European companies have to compete heavily with Japanese companies will often require the combined use of the IPC, ECLA (the EPO's classification system) and FI/F-terms.
This session will familiarise you with the overall concept and philosophy of FI/F-terms and will also explain 'broad facet' classification, designed for cross-technology searches in Japan (eg in the field of nanotechnology).
The practical part of the training session will illustrate different ways of identifying relevant FI symbols and F-terms and discuss searching with FI classes and F-terms on the JPO's free 'Industrial Property Digital Library' internet database.
This training session is the ideal preparation for those attending discussion rounds B ("F-terms at the JPO and the EPO (case study)") and F ("Searches with F-terms on commercial databases") on 18 April 2008.