Are you familiar with Y02/Y04S?

If you are a user of the Y02/Y04S classification scheme for climate change mitigation technologies, we invite you to participate in a short survey. It will only take a few minutes of your time and your answers will help us to improve the scheme further.
You can complete the survey in English, German or French language

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Patent statistics and patent mapping

By gathering, analysing and visualising relevant patent data, patent statistics and mapping help you use patent information to make intelligent business decisions. Understanding complex patent information becomes easy when you use statistical analysis and patent mapping to visualise large sets of patent data.

Patent statistical analysis and patent mapping are essential tools in the world of patent information, whether you wish to:

  • carry out a risk assessment
  • analyse the competition
  • identify business opportunities or
  • keep up to date with the latest technological trends.

The EPO's Patent information services for experts, including the EPO Worldwide Patent Statistical Database (PATSTAT) are ideal for these purposes. Using these products, you can keep an eye on the competition without leaving your desk! The advantages include the large number of searchable fields, the ready-to-use interface and the vast amount of data they cover.

Read more about the EPO's subscription databases.

There are a range of commercial products on the market for analysing patent sets and presenting the results visually and in a meaningful way.


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