PATSTAT, also known as the EPO Worldwide Patent Statistical Database, is a snapshot of the EPO master documentation database (DOCDB) with worldwide coverage. It contains more than 20 tables with bibliographic data, citations and family links of about 70 million applications of more than 80 countries.
There are two flavours of PATSTAT:
PATSTAT is specifically designed for statistical analysis.
Access
Currently PATSTAT online is provided as a test version (beta).
PATSTAT online is hosted on the PISE platform, i. e. EPOs Patent information services for experts. A graphical user interface is provided which accepts SQL-like queries. Also, some special features for statistical analysis and visualisation are included.
All subscribers of PATSTAT raw data are currently eligible to access the Expert mode of PATSTAT (test version). Please contact csc@epo.org to get a user name and password.
You can register for a 30 days free trial, even if you have not subscribed to PATSTAT raw data:
To try Expert mode of PATSTAT free of charge for a limited period, please contact epal@epo.org. You will receive your username and password by e-mail.
The data is updated twice per year, usually April and October.
PATSTAT related training can be found at:
Calendar of events (enter "statistic" as keyword)