T 0801/00 of 25.06.2003
- European Case Law Identifier
- ECLI:EP:BA:2003:T080100.20030625
- Date of decision
- 25 June 2003
- Case number
- T 0801/00
- Petition for review of
- -
- Application number
- 91110658.1
- IPC class
- G01N 23/223
- Language of proceedings
- English
- Distribution
- Distributed to board chairmen (C)
- Download
- Decision in English
- OJ versions
- No OJ links found
- Other decisions for this case
- -
- Abstracts for this decision
- -
- Application title
- System for analyzing metal impurity on the surface of a single crystal semiconductor by using total reflection of x-rays fluorescence
- Applicant name
- KABUSHIKI KAISHA TOSHIBA
- Opponent name
- GKSS-Forschungszentrum Geesthacht GmbH
- Board
- 3.4.02
- Headnote
- -
- Relevant legal provisions
- European Patent Convention Art 114(2) 1973European Patent Convention Art 56 1973European Patent Convention R 64(b) 1973
- Keywords
- Admissibilty of the appeal (yes)
Late filed documents (not admitted) - Catchword
- -
- Cited cases
- T 0252/95
- Citing cases
- -
ORDER
For these reasons it is decided that:
The appeal is dismissed.